| Goal |
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Higher reliability and lower cost with higher quality are meant to be designed in.
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| DFM-Design for Manufacturability Analysis |
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Thoroughly review of customers design including FAB circuit/trace routing, component positioning and spacing, potential fault reduction and process selection, so to reach the lowest possible overall cost at the early stage of volume production.
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Reviewed with AutoCAD, Pro/E and Valor by our experienced engineering staffs.
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| DFT - Design for Testability Analysis |
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A complete review of the circuit design and trace routing to increase test accessibility and device testability so to increase the overall coverage over AOI, 3-D X-Ray, Flying Probe Test and In-Circuit-Test. To assure the lowest possible risk and best product salvage opportunity is an option when surprises happen in the volume stage.
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Reviewed with GR Force II, FAB Master, Pads and Valor.
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| Concurrent Engineering Support staff (12+) |
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We work hand in hand with customer's engineering staff to provide prompt feedback and solutions to improve the manufacturing process.
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Virtual factory, virtually you own and control the operations.
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In-house Flying Probe Test Review, Programming, And Test over GenRad Pilot LX.
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Customer Specific Function Test Support With- Integrated 3-D Report. |
